Artículo de revisión

Caracterización de vermiculitas pilarizadas con Al-Zr, Al-Hf y Al-Ce por espectroscopía de fotoelectrones emitidos por rayos-X

Ana María Campos, Sonia Moreno, Rafael Alberto Molina


Se utilizó la espectroscopia de fotoelectrones emitidos por rayos-X para establecer la concentración relativa y el ambiente químico de las especies introducidas en una serie de vermiculitas pilarizadas con precursores mixtos de Al-Zr, Al-Hf y Al-Ce. Las energías de enlace observadas evidenciaron que es más probable encontrar zirconio y hafniocomo Zr-O(H) - o Zr-Si-y HfO2, y que estos exhiben, además, una mayor dispersión en la superficie de la vermiculita en comparación con las especies de cerio (Ce2O3), las cuales se encuentran principalmente en el interior de las láminas de arcilla. Por un lado, el análisis químico mostró que con las soluciones de Al-Hf y Al-Zr, la introducciónde hafnio y de zirconio era completa dentro del rango de 0,5 a 2 mmol g-1 de arcilla, pero que la eficacia se reducíacon cantidades más grandes. Por otro lado, la introducción de cerio en las soluciones de Al-Ce pudo considerarse completa dentro del rango evaluado.

Palabras clave

Pillared vermiculite, zirconium, hafnium, cerium, XPS

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